The analytical and numerical analysis of scattering waves structure in the near and far-fields brings sufficient information for the inspection of product surfaces as well as for detecting and estimation of surface defect parameters. In order to conduct numerical simulation of the processes of scattering on the technologically treated surfaces, the program of numerical synthesis of random surfaces with the given statistical properties, such as dispersion and the length of correlation, has been developed. The method of optoelectronic treatment of scatter fields based on the use of the advanced spatial light modulators (SLM) is suggested.