The experimental data on high-temperature dielectric relaxation in linear PE samples with different thermal prehistories (slow cooling, quenching, and annealing) are described. The measurements are conducted at temperatures ranging from 0 to 80°C. Dielectric losses are measured with a high accuracy in wide diapason of frequencies. These dielectric measurements allow one to reveal changes in the frequency dependence of losses with temperature. This effect of thermal prehistory of the sample and applied stress is explained within the framework of the molecular model of chain diffusion between crystalline and amorphous phases in PE.
Polymer Science, Ser. A, Vol. 50, No. 2, pp. 181–189 (2008)